Recently, global technology leader HONOR invited Philippine tech media to visit its offices in Beijing to see the brand’s research and development facilities.
The tour lasted an entire day and took place across several laboratories (one of which is nearly 6,000 sqm just for testing phone durability).
It gave a glimpse of how HONOR has been developing, testing, and innovating its products and devices to ensure compatibility and compliance with not only local but global smartphone standards and protocols.
HONOR General Innovation Laboratory
Passive Device Admission Certification Laboratory
This laboratory supports HONOR’s thousands of coded device admission test systems, from tiny passive devices (including resistors, capacitors, inductors, third-generation semiconductor tubes, and crystal oscillators) to hundreds of watts of power ICs, etc.,
It utilizes the industry’s most advanced batch certification capabilities, full-parameter, and full-environment testing capabilities, covering device materials, device technology, device design simulation, and other fields of capabilities, with device life cycle reliability assessment and failure analysis methods.
MEMS accelerometers, IMUs and Other Inertial Devices Access Certification Laboratory
The second laboratory is for performance testing, calibration, failure analysis, and algorithm validation. With industry-leading aerospace-grade inertial device testing capabilities, the equipment covers the current and next ten years of consumer inertial device testing needs.
The brand has an ultra-high frequency vibration exciter and is the only terminal company with this testing capability. HONOR also built the industry’s first powered batch testing platform for MEMS inertial devices to achieve device performance verification under terminal-like working conditions.
Audio Laboratory HI-FI Laboratory
The HIFI Laboratory is a subjective effect experience area with an 11.2-channel stereo media playback capability, providing a benchmark environment for the audio experience design.
HONOR evaluates various audio effects in this lab, including voice quality of calls, noise playback and acoustic parameters of headphones, sound reception and video recording of mobile phones, among others.
Antenna and Specific Absorption Rate (SAR) Laboratories
The Antenna Laboratory and Specific Absorption Rate (SAR) Laboratory use specialized chambers for testing device antenna signals. Meeting CTIA test standards, these chambers simulate different scenarios to meet the needs of different customers worldwide.
HONOR also tests how much the human body can absorb signals through these antennas, ensuring that each device meets CE and FCC test standards.
HONOR Terminal Reliability Laboratory
This laboratory, covering an area of nearly 6,000 square meters, implements mobile phone hardware reliability testing. It simulates daily scenarios of mobile phone usage and includes testing of mechanical reliability, adaptability, and protection reliability.
Some of the test areas in this lab include the following:
- Mechanical Strength and Durability Test Area – testing of mobile phone stiffness, strength of headphone/USB and other interfaces, and lifespan of device physical buttons.
- Protection Reliability Test Area – waterproof, dustproof, salt spray corrosion resistance testing, among others.
- Mechanical Impact Test Area – testing of mobile phone directional drops, roller tests, and low-height micro-drop tests are all conducted here.
- Detection Area (Before-and-after Reliability) Test Area – all prototypes undergoing reliability testing will undergo before-and-after testing in this area. Functions and performance of RF, audio, camera, display touch, and others, are noted here.
Environmental Reliability Laboratory
This lab focuses on testing the devices’ environmental endurance. Simulations of high and low temperatures, temperature shocks, and high humidity are conducted here to ensure product quality and improvements for the future.
Failure Analysis Laboratory
With a total area of 800 square meters, this lab focuses on analyzing failure modes, mechanisms, and the root causes of failed samples. After analysis, improvement plans in design, technology, and manufacturing are developed.
It features the following areas:
- Reception Area – where to “feel the pulse” of samples through various electrical testing equipment. Currently, signal testing of a single 90nm BCD transistor can be completed.
- Section Analysis Area – by performing cutting, grinding, polishing and other operations on the sample, a preliminary analysis and judgment can be made on the target area of the sample cross-section.
- Non-destructive Analysis Area – Without affecting the function and operating condition of the sample or destroying the failure site, X-ray, ultrasonic and other technologies are used to detect samples.
- Material Analysis Area – using an electron microscope to analyze nanoscale materials and components and observe the most microscopic causes of failure. CP and FIB can also perform low-stress micron-level cutting and sample processing, similar to “minimally invasive surgery”.
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Source: Gadget Pilipinas
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